Seeking the Yield Barrier: High-Dimensional SRAM Evaluation Through Optimal Manifold
DescriptionEfficient yield estimation is a central issue in modern submicrometer circuits.
In this work, we propose a novel sampling method, named Optimal Manifold Important Sampling (OPTIMIS), which extends the classic norm minimization from optimal vectors to optimal manifolds. We implement a normalization ﬂow, which uses a parallel updating scheme to update itself to approximate the ground truth failure probability. Also, for the first time, we show the close connection between the surrogate-based and importance sampling-based yield estimation under our framework. Experiments of several SRAM problems show the superiority of our method with up to 2.5x than the SOTA methods.
TimeThursday, July 13th11:25am - 11:40am PDT
Location3010, 3rd Floor
Design for Test and Silicon Lifecycle Management