Presentation
Accurate and Fast Method to Close Design vs Silicon Gap
DescriptionIn advanced technology nodes, the Model-to-Hardware Correlation (MHC) problem, also known as Silicon-to-Spice (S2S) error became a critical factor that affects Silicon reliability. Managing MHC is particulary difficult for new technology node, where design and technology is developed at the same time. Conventional approach is to re-characterize PDK/DK to match Silicon, which often takes several months. In this work we propose a novel modeling methodogy to accurately, yet quickly reflect MHC changes. Simulation results shows that the proposed technique match accuracy of fully re-characterized DK in less than one day.
Event Type
Work-in-Progress Poster
TimeWednesday, July 12th6:00pm - 7:00pm PDT
LocationLevel 2 Lobby
AI
Autonomous Systems
Cloud
Design
EDA
Embedded Systems
RISC-V
Security