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STCG: State Aware Test Case Generation for Simulink Models
DescriptionAutomatic generation of high-coverage test cases can improve testing efficiency. We propose STCG, an improved test case generator for complex Simulink models using step solving method. STCG solves only one iteration of the model each time, then dynamically executes the model once to obtain the model state based on the solved result. After that, it solves the remaining coverage again based on the new model state until all the coverage requirements are satisfied. We evaluated STCG on benchmark models. Compared to SLDV and SimCoTest, the test coverage by STCG achieves an improvement of 12.4%-106.2% and 44.9%-124.3%, respectively.
Event Type
Research Manuscript
TimeThursday, July 13th10:40am - 10:55am PDT
Location3010, 3rd Floor
Topics
EDA
Keywords
Design for Test and Silicon Lifecycle Management