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DTSTART:19700308T020000
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BEGIN:VEVENT
DTSTAMP:20230712T175214Z
LOCATION:3010\, 3rd Floor
DTSTART;TZID=America/Los_Angeles:20230713T103000
DTEND;TZID=America/Los_Angeles:20230713T104000
UID:dac_DAC 2023_sess143_LIGHTNING147@linklings.com
SUMMARY:Lightning Talk: Architecture Solutions for Emerging Memory Based S
 torage and Computing to Achieve High Yield and Low Error Rate
DESCRIPTION:Research Manuscript\n\nK.T. Tim Cheng (Hong Kong University of
  Science and Technology)\n\nWe articulate the needs and benefits of employ
 ing novel architecture and circuit solutions to addressing the yield and r
 eliability challenges of emerging non-volatile memories. As an illustrativ
 e example, we present the concept and mechanism of “ratio-based” encoding 
 for resistive memory cells which significantly reduces the bit error proba
 bility and improves the robustness of resistive memory for both in-memory 
 computing and storage. We experimentally validated the findings and demons
 trate that this solution achieves up to 3 orders of magnitude lower bit er
 ror probability.\n\nTopic: EDA\n\nKeyword: Design for Test and Silicon Lif
 ecycle Management\n\nSession Chair: Amit Majumdar (AMD)
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