Presentation
Lightning Talk: Architecture Solutions for Emerging Memory Based Storage and Computing to Achieve High Yield and Low Error Rate
DescriptionWe articulate the needs and benefits of employing novel architecture and circuit solutions to addressing the yield and reliability challenges of emerging non-volatile memories. As an illustrative example, we present the concept and mechanism of “ratio-based” encoding for resistive memory cells which significantly reduces the bit error probability and improves the robustness of resistive memory for both in-memory computing and storage. We experimentally validated the findings and demonstrate that this solution achieves up to 3 orders of magnitude lower bit error probability.
Event Type
Research Manuscript
TimeThursday, July 13th10:30am - 10:40am PDT
Location3010, 3rd Floor
EDA
Design for Test and Silicon Lifecycle Management